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Sample Analysis' Offered
Topography
Advanced Imaging Models
Advanced Imaging Models
High resolution topography imaging using the highest resolution atomic force microscope instrument.
Advanced Imaging Models
Advanced Imaging Models
Advanced Imaging Models
Advanced AFM instruments with multiple parallel lock-in data processing allows differentiation of materials electrical, magnetic and other properties
Texture Analysis
Advanced Imaging Models
Texture Analysis
Topographic image of a sample can tell you much more than the height roughness, the texture analysis provides much more data.
Sample images
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Do you want to increase your knowledge? Obtain advanced training? or develop methods, we have something to match your needs.